• 专利标题: METHOD AND SYSTEM FOR APPLYING A PATTERN ON A MASK LAYER
  • 申请号: US17439919
    申请日: 2020-03-19
  • 公开(公告)号: US20220176688A1
    公开(公告)日: 2022-06-09
  • 发明人: Dirk Ludo Julien DE RAUW
  • 申请人: XEIKON PREPRESS N.V.
  • 申请人地址: BE IEPER
  • 专利权人: XEIKON PREPRESS N.V.
  • 当前专利权人: XEIKON PREPRESS N.V.
  • 当前专利权人地址: BE IEPER
  • 优先权: NL2022776 20190320
  • 国际申请: PCT/EP2020/057645 WO 20200319
  • 主分类号: B41C1/00
  • IPC分类号: B41C1/00
METHOD AND SYSTEM FOR APPLYING A PATTERN ON A MASK LAYER
摘要:
A method for applying a pattern on a mask layer includes obtaining an image file representing pixels with a first pixel size in a first direction parallel to an edge of the pixel, and a second pixel size in a second direction perpendicular to the first direction, where the first and second pixel size are the same or different, treating the mask layer such that a plurality of areas with altered physical properties are created in the mask layer, the plurality of areas corresponding to a plurality of pixels of the image file, where the treatment is done such that a first and/or a second area size of an area of said plurality of areas, seen in said first and/or said second direction, is smaller than the first and/or second pixel size, respectively.
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