- 专利标题: AUTOMATED SAMPLE PREPARATION SYSTEM FOR DIAGNOSTIC TESTING OF SAME
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申请号: US17503864申请日: 2021-10-18
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公开(公告)号: US20220137080A1公开(公告)日: 2022-05-05
- 发明人: Michael T. VanSickler , Kevin Bailey , Christopher John Tesluk , Dwight Livingston , Steven C. Rotundo , Stephen Robert LaChance , Michael J. Touma , Brian James McKeen , Gerard Sevigny
- 申请人: BECTON DICKINSON AND COMPANY
- 申请人地址: US NJ Franklin Lakes
- 专利权人: BECTON DICKINSON AND COMPANY
- 当前专利权人: BECTON DICKINSON AND COMPANY
- 当前专利权人地址: US NJ Franklin Lakes
- 主分类号: G01N35/04
- IPC分类号: G01N35/04 ; G16H10/40 ; G01N35/00
摘要:
An automated pre-analytical processing method and an apparatus for pre-analytical processing of samples to be forwarded to an adjacent analyzer for analysis. Rack label information is read and communicated to a processor. From the rack label information, the processor determines where to route the rack. The pre-analytical system has a rack robot that conveys racks to discrete locations depending upon the routing information assigned to the rack by the processor. The pre-analytical system has an automated station that reads the labels of individual sample containers in the rack that are brought to the automated station on instructions from the processor. Depending on the type of sample container and the type of sample disposed therein, the samples are either prepared for analysis by the automated station or the sample containers are directly passed through the automated station. Prepared samples and passed through samples are passed individually to a batching rack.
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