Invention Application
- Patent Title: METROLOGY SENSOR FOR POSITION METROLOGY
-
Application No.: US17277353Application Date: 2019-08-27
-
Publication No.: US20220035257A1Publication Date: 2022-02-03
- Inventor: Sebastianus Adrianus GOORDEN , Simon Reinald HUISMAN , Simon Gijsbert Josephus MATHIJSSEN , Henricus Petrus Maria PELLEMANS
- Applicant: ASML Netherlands B.V.
- Applicant Address: NL Veldhoven
- Assignee: ASML Netherlands B.V.
- Current Assignee: ASML Netherlands B.V.
- Current Assignee Address: NL Veldhoven
- Priority: EP18195488.4 20180919,EP19150245.9 20190103
- International Application: PCT/EP2019/072762 WO 20190827
- Main IPC: G03F7/20
- IPC: G03F7/20

Abstract:
Disclosed is a metrology device (1600) configured to produce measurement illumination comprising a plurality of illumination beams, each of said illumination beams being spatially incoherent or pseudo-spatially incoherent and comprising multiple pupil points in an illumination pupil of the metrology device. Each pupil point in each one of said plurality of illumination beams has a corresponding pupil point in at least one of the other illumination beams of said plurality of illumination beams thereby defining multiple sets of corresponding pupil points, and the pupil points of each set of corresponding pupil points are spatially coherent with respect to each other.
Public/Granted literature
- US11360399B2 Metrology sensor for position metrology Public/Granted day:2022-06-14
Information query
IPC分类: