There is provided an inspection apparatus for inspecting a plate-shaped inspection target being conveyed. The inspection apparatus includes a light source configured to emit a linear light. beam extending along the thickness direction of the inspection target to irradiate a side surface at a lateral end of the inspection target in a width direction orthogonal to a conveying direction of the inspection target, an imager configured to capture the light beam emitted from the light source and irradiating the side surface at the lateral end of the inspection target, an imager driving device configured to move the imager, and an imager controller configured to control the position of the imager. The imager controller is configured to control the position of the imager according to the position of the lateral end of the inspection target.