Invention Application
- Patent Title: SYSTEM AND METHOD FOR PREDICTING CROP YIELD
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Application No.: US16900087Application Date: 2020-06-12
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Publication No.: US20200380617A1Publication Date: 2020-12-03
- Inventor: David Murr , Shadrian Strong , Kristin Lavigne , Lars P. Dyrud , Jonathan T. Fentzke
- Applicant: OmniEarth, Inc.
- Main IPC: G06Q50/02
- IPC: G06Q50/02 ; G06T7/00 ; G01W1/10 ; G06N5/02 ; G06F16/29 ; G06F16/583 ; A01G15/00 ; G06K9/00 ; A01B79/00

Abstract:
A device includes an image data receiving component, a vegetation index generation component, a crop data receiving component, a masking component and a multivariate regression component. The image data receiving component receives image data of a geographic region. The vegetation index generation component generates an array of vegetation indices based on the received image data, and includes a plurality of vegetation index generating components, each operable to generate a respective individual vegetation index based on the received image data. The crop data receiving component receives crop data associated with the geographic region. The masking component generates a masked vegetation index based on the array of vegetation indices and the received crop data. The multivariate regression component generates a crop parameter based on the masked vegetation index.
Public/Granted literature
- US11145008B2 System and method for predicting crop yield Public/Granted day:2021-10-12
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