发明申请
- 专利标题: METHOD AND APPARATUS FOR GENERATING MEASUREMENT PLAN FOR MEASURING X-RAY CT
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申请号: US16299513申请日: 2019-03-12
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公开(公告)号: US20190287274A1公开(公告)日: 2019-09-19
- 发明人: Kozo ARIGA , Gyokubu CHO , Hidemitsu ASANO , Masato KON
- 申请人: MITUTOYO CORPORATION
- 申请人地址: JP Kanagawa
- 专利权人: MITUTOYO CORPORATION
- 当前专利权人: MITUTOYO CORPORATION
- 当前专利权人地址: JP Kanagawa
- 优先权: JP2018-051551 20180319
- 主分类号: G06T11/00
- IPC分类号: G06T11/00 ; G01N23/046
摘要:
When generating a measurement plan for measuring X-ray CT that performs X-ray irradiation while rotating a test object, and in doing so acquires projection image data, reconstructs volume data from the projection image data, and measures a targeted measurement location in the volume data, the present invention calculates required measurement accuracy and a measurement field of view range based on tolerance information included in CAD data of the test object and a measurement location on the test object defined by a measurement operator ahead of time, and automatically generates, from this information, an optimized measurement plan that minimizes the number of measurements.
公开/授权文献
信息查询
IPC分类:
G | 物理 |
G06 | 计算;推算或计数 |
G06T | 一般的图像数据处理或产生 |
G06T11/00 | 2D〔二维〕图像的生成 |