Invention Application
- Patent Title: INSPECTION JIG, SUBSTRATE INSPECTION DEVICE, AND METHOD FOR MANUFACTURING INSPECTION JIG
-
Application No.: US16319826Application Date: 2017-07-24
-
Publication No.: US20190265276A1Publication Date: 2019-08-29
- Inventor: Norihiro OTA
- Applicant: Nidec-Read Corporation
- Applicant Address: JP Kyoto
- Assignee: Nidec-Read Corporation
- Current Assignee: Nidec-Read Corporation
- Current Assignee Address: JP Kyoto
- Priority: JP2016-148507 20160728
- International Application: PCT/JP2017/026632 WO 20170724
- Main IPC: G01R1/073
- IPC: G01R1/073 ; G01R3/00 ; G01R31/28

Abstract:
This inspection jig is provided with: a plurality of probes (Pr) for bringing leading end portions (Pra) thereof into contact with a plurality of inspection points on a substrate (100); a support member (300) that supports the probes (Pr) in a state wherein the leading end portions (Pra) are disposed to be in contact with the inspection points on the substrate (100) respectively; device-side connecting terminals (36) electrically connected to an inspection device main body (2); a plurality of standard disposition electrodes (332), which are conducted to the device-side connecting terminals (36), and are disposed in previously set standard disposition; and a conversion block (31), which has a first surface (311) and a second surface (312) on sides opposite to each other, and in which first electrodes (E1) are formed on the first surface (311), and in which second electrodes (E2) are formed on the second surface (312).
Information query