Invention Application
- Patent Title: MECHANICAL FAILURE MONITORING, DETECTION, AND CLASSIFICATION IN ELECTRONIC ASSEMBLIES
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Application No.: US15900668Application Date: 2018-02-20
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Publication No.: US20190257793A1Publication Date: 2019-08-22
- Inventor: Kyle Yazzie , Rajesh Kumar Neerukatti , Naga Sivakumar Yagnamurthy , David C. McCoy , Pramod Malatkar , Frank P. Prieto
- Applicant: Intel Corporation
- Applicant Address: US CA Santa Clara
- Assignee: Intel Corporation
- Current Assignee: Intel Corporation
- Current Assignee Address: US CA Santa Clara
- Main IPC: G01N29/14
- IPC: G01N29/14 ; G01N29/44

Abstract:
Disclosed herein are systems and methods for mechanical failure monitoring, detection, and classification in electronic assemblies. In some embodiments, a mechanical monitoring apparatus may include: a fixture to receive an electronic assembly; an acoustic sensor; and a computing device communicatively coupled to the acoustic sensor, wherein the acoustic sensor is to detect an acoustic emission waveform generated by a mechanical failure of the electronic assembly during testing.
Public/Granted literature
- US11327050B2 Mechanical failure monitoring, detection, and classification in electronic assemblies Public/Granted day:2022-05-10
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