Invention Application
- Patent Title: SPECTROMETER AND SPECTRUM MEASUREMENT METHOD UTILIZING SAME
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Application No.: US16069241Application Date: 2017-07-31
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Publication No.: US20190025120A1Publication Date: 2019-01-24
- Inventor: Kyeong Seok LEE , Won Mok KIM , Gyu Weon HWANG , In Ho KIM , Wook Seong LEE , Doo Seok JEONG
- Applicant: SAMSUNG ELECTRONICS CO., LTD.
- Applicant Address: KR Suwon-si, Gyeonggi-do
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR Suwon-si, Gyeonggi-do
- Priority: KR10-2016-0106422 20160822; KR10-2017-0053894 20170426
- International Application: PCT/KR2017/008256 WO 20170731
- Main IPC: G01J3/02
- IPC: G01J3/02 ; G01J3/453 ; G01J3/28

Abstract:
Present invention provides a spectrometer including a first unit spectral filter configured to absorb or reflect light in a part of a wavelength band of a light spectrum of an incident target, a second unit spectral filter configured to absorb or reflect light in a wavelength band different from the part of the wavelength band, a first light detector configured to detect a first light spectrum passing through the first unit spectral filter, a second light detector configured to detect a second light spectrum passing through the second unit spectral filter, and a processing unit configured to perform a function of restoring a light spectrum of the target incident from spectra of light detected from the first light detector and the second light detector.
Public/Granted literature
- US10908019B2 Spectrometer and spectrum measurement method utilizing same Public/Granted day:2021-02-02
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