Systems and methods are provided that facilitating an error analysis of a product deficiency. The system may comprise a processor configured to: store lifecycle information related to a lifecycle of the product in a lifecycle database; store manufacturing operations information related to manufacturing operations of the product in a manufacturing operations database; store further lifecycle information related to lifecycle issues and/or non-conformances of the product in the lifecycle database; store further manufacturing operations information related to concerns and/or complaints of the product in the manufacturing operations database; store first reference information related to the further lifecycle information from the lifecycle database in the manufacturing operations database; generate a graphical user interface (GUI) through a display device that enables the manufacturing operations information stored in the manufacturing operations database; and cause the manufacturing operations information, the further manufacturing operations information, and the further lifecycle information to be displayed in the GUI.