Invention Application
- Patent Title: PURITY MONITOR
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Application No.: US15291712Application Date: 2016-10-12
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Publication No.: US20180142937A1Publication Date: 2018-05-24
- Inventor: Paul L. Buelow
- Applicant: Raytheon Company
- Main IPC: F25D19/00
- IPC: F25D19/00 ; G01N5/04 ; F25B9/02 ; F25B21/02

Abstract:
A purity monitor is provided. The purity monitor includes a cryo-cooler and a piezo-electric crystal microbalance that may have a matte finish. The cryo-cooler includes a nozzle and plumbing components disposed to supply a fluid having a working pressure of up to 10,000 psig to the nozzle. The nozzle provides for locating substantially all of a pressure drop of the cryo-cooler near an exit thereof. The nozzle sprays fluid onto the piezo-electric crystal microbalance and the piezo-electric crystal microbalance measures a mass of non-volatile residue (NVR) left thereon by the spraying. Respective temperatures of the fluid and the piezo-electric crystal microbalance are controllable based on a type of the NVR.
Public/Granted literature
- US10054357B2 Purity monitor Public/Granted day:2018-08-21
Information query
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