Method of Forming Fine Patterns Using Block Copolymer
Abstract:
Provided is a method of forming fine patterns capable of minimizing LER and LWR to form high quality nanopatterns, by using a block copolymer having excellent etching selectivity. Provided is a block copolymer comprising a first block having a repeating unit represented by the following Chemical Formula 1, and a second block having a repeating unit represented by the following Chemical Formula 2:
Public/Granted literature
Information query
Patent Agency Ranking
0/0