Invention Application
- Patent Title: METHODS AND SYSTEMS FOR GENERATING FUNCTIONAL TEST PATTERNS FOR MANUFACTURE TEST
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Application No.: US15809389Application Date: 2017-11-10
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Publication No.: US20180067162A1Publication Date: 2018-03-08
- Inventor: Franco Motika , John D. Parker , Gerard M. Salem
- Applicant: International Business Machines Corporation
- Main IPC: G01R31/3177
- IPC: G01R31/3177 ; G01R31/317 ; G01R31/28

Abstract:
Embodiments include methods, computer systems and computer program products for generating functional test patterns for diagnostics, characterization and manufacture test. Aspects include: receiving from a system designer, via a design verification tool module, certain verification sequences configured to verify system functional design, executing the verification sequences received at a functional exerciser module against a device to generate various traces, capturing traces generated in emulation compatible format, processing traces captured via trace processor module, including parsing the traces captured, verifying data integrity of the traces captured, and summarizing statistics of the traces captured, generating, via an emulated pattern generator module, a predetermined number of emulated test patterns having tester independent format ‘streams’ of data compatible with a device test port based on output of the trace processor module, and processing, via a tester specific post-processor module, the emulated test patterns to generate functional test patterns using a tester specific post-processor module.
Public/Granted literature
- US10209306B2 Methods and systems for generating functional test patterns for manufacture test Public/Granted day:2019-02-19
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