- 专利标题: HARDENED LAYER DEPTH MEASURING APPARATUS
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申请号: US15554319申请日: 2016-03-02
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公开(公告)号: US20180051975A1公开(公告)日: 2018-02-22
- 发明人: Yoshitaka MISAKA , Kazuhiro KAWASAKI , Kenta SAKURAI , Yuji GOTOH
- 申请人: NETUREN CO., LTD. , OITA UNIVERSITY
- 申请人地址: JP Tokyo JP Oita
- 专利权人: NETUREN CO., LTD.,OITA UNIVERSITY
- 当前专利权人: NETUREN CO., LTD.,OITA UNIVERSITY
- 当前专利权人地址: JP Tokyo JP Oita
- 优先权: JP2015-045307 20150306
- 国际申请: PCT/JP2016/001142 WO 20160302
- 主分类号: G01B7/26
- IPC分类号: G01B7/26 ; G01B7/06 ; G01N27/72
摘要:
An apparatus is provided to measure a depth of a hardened layer formed at a surface layer of a quenched workpiece. The apparatus includes an exciting coil configured to generate a magnetic flux to magnetize the workpiece and a detecting coil configured to detect the magnetic flux generated by the exciting coil. The exciting coil has a U-shaped excitation core portion and an excitation coil portion wound on the excitation core portion. The excitation core portion is arranged such that distal ends of magnetic poles of the excitation core portion face the workpiece. The detecting coil has a detection core portion and a detection coil wound on the detection core portion. The detection core portion is arranged between the magnetic poles of the excitation core portion and along a surface of the workpiece.
公开/授权文献
- US10458775B2 Hardened layer depth measuring apparatus 公开/授权日:2019-10-29
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