- 专利标题: X-Ray Backscatter Inspection System
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申请号: US15601155申请日: 2017-05-22
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公开(公告)号: US20170336526A1公开(公告)日: 2017-11-23
- 发明人: Anatoli Arodzero , Sergey V. Kutsaev , Vitaliy Ziskin
- 申请人: Radiabeam Technologies LLC
- 申请人地址: US CA Santa Monica
- 专利权人: Radiabeam Technologies, LLC
- 当前专利权人: Radiabeam Technologies, LLC
- 当前专利权人地址: US CA Santa Monica
- 主分类号: G01V5/00
- IPC分类号: G01V5/00 ; G01N23/203
摘要:
Apparatus and methods for Compton scattering radiography employing a variable energy X-ray source and a detector capable of detecting the temporal intensity profile of scattered X-ray pulses disposed on one side of an object to be imaged. Based on analysis of the measurement of the instantaneous intensity of the detected photons and the beam position relative to the object, an image is generated. Each voxel can be reconstructed to yield a measure of variation in the density of the material of the object.
公开/授权文献
- US10481113B2 X-ray backscatter inspection system 公开/授权日:2019-11-19
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