Invention Application
- Patent Title: Depth Measurement Techniques for a Multi-Aperture Imaging System
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Application No.: US15292872Application Date: 2016-10-13
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Publication No.: US20170230638A1Publication Date: 2017-08-10
- Inventor: Andrew Augustine Wajs , David D. Lee , Seungoh Ryu , Taekun Woo
- Applicant: Dual Aperture International Co. Ltd.
- Main IPC: H04N13/02
- IPC: H04N13/02

Abstract:
A multi-aperture imaging system determines depth map information. A series of image frames of a scene are captured. The frames include a normal image frame and at least one structured image frame. The multi-aperture imaging system determines edge information of an object in the scene using a deblur technique and the normal image frame. The multi-aperture imaging system determines fill depth information for the object based in part on the at least one structured image frame. The multi-aperture imaging system generates a depth map of the scene using the edge depth information and the fill depth information.
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