- 专利标题: Two-Transistor SRAM Semiconductor Structure and Methods of Fabrication
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申请号: US15426588申请日: 2017-02-07
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公开(公告)号: US20170148795A1公开(公告)日: 2017-05-25
- 发明人: Harry Luan , Bruce L. Bateman , Valery Axelrad , Charlie Cheng , Christophe J. Chevallier
- 申请人: Kilopass Technology, Inc.
- 主分类号: H01L27/102
- IPC分类号: H01L27/102 ; H01L21/8249
摘要:
A two-transistor memory cell based upon a thyristor for an SRAM integrated circuit is described together with a process for fabricating it. The memory cell can be implemented in different combinations of MOS and bipolar select transistors, or without select transistors, with thyristors in a semiconductor substrate with shallow trench isolation. Standard CMOS process technology can be used to manufacture the SRAM.
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