Invention Application
- Patent Title: DUAL-ENERGY RAY SCANNING SYSTEM, SCANNING METHOD AND INSPECTING SYSTEM
-
Application No.: US15278043Application Date: 2016-09-28
-
Publication No.: US20170094762A1Publication Date: 2017-03-30
- Inventor: Yu Hu , Shangmin Sun , Juan Zheng , Bicheng Liu
- Applicant: Nuctech Company Limited
- Applicant Address: CN Beijing
- Assignee: Nuctech Company Limited
- Current Assignee: Nuctech Company Limited
- Current Assignee Address: CN Beijing
- Priority: CN201510627055.X 20150928
- Main IPC: H05G1/30
- IPC: H05G1/30 ; G01V5/00 ; G21K1/10

Abstract:
The present invention discloses a dual-energy ray scanning system, scanning method and inspecting system and relates to the radiation scanning, imaging and detecting field. The dual-energy ray scanning system comprises a ray source for alternately emitting a high energy ray and a low energy ray; a filter comprising a low energy filtering element and a low energy transmitting element; and a control device for controlling said ray source and said filter to make said low energy filtering element of said filter be aligned with a beam exit direction of said ray source when said ray source emits a high energy ray so as to filter low energy portion of said high energy ray out and transmit high energy portion of said high energy ray out, and for controlling said ray source and said filter to make said low energy transmitting element of said filter be aligned with said beam exit direction of said ray source when said ray source emits the low energy ray so as to transmit said low energy ray out. This not only can improve transmissivity of the high energy ray, but also does not lose the spatial wire resolution of the low energy ray, and this guarantees the index of transmissivity and the index of spatial wire resolution at the same time, such that the dual-energy ray can sufficiently utilize a difference in its penetration characteristics to recognize the object to be inspected, thereby reaching the objective of security inspection.
Public/Granted literature
- US10285252B2 Dual-energy ray scanning system, scanning method and inspecting system Public/Granted day:2019-05-07
Information query