发明申请
- 专利标题: PHOTOMETRIC APPARATUS
- 专利标题(中): 光学设备
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申请号: US14843310申请日: 2015-09-02
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公开(公告)号: US20160231174A1公开(公告)日: 2016-08-11
- 发明人: Tomohide KANZAWA , Hiroshi HARADA , Yasushi FUKAZAWA , Eigo YOSHIKAWA , Hirohiko OKABE
- 申请人: Sekonic Corporation
- 优先权: JP2014-180371 20140904
- 主分类号: G01J3/50
- IPC分类号: G01J3/50 ; G01J3/02
摘要:
Disclosed is a photometric apparatus improved in measurement precision by improving the state of light incident to a sensor. The photometric apparatus 1 includes a photometric sensor 30 into which light which is an object to be measured is incident, a signal processing element for processing a sensor output by the photometric sensor, and optical systems 50, 100, 92, 93 and 150 which introduces external light into the photometric sensor, wherein a columnar fiber rod 100 in which a center axis is provided along a direction perpendicular to a light receiving surface of the photometric sensor is provided at a part of the optical system.
公开/授权文献
- US09759603B2 Photometric apparatus 公开/授权日:2017-09-12
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