Invention Application
- Patent Title: EXPOSURE APPARATUS
- Patent Title (中): 曝光装置
-
Application No.: US14983962Application Date: 2015-12-30
-
Publication No.: US20160187788A1Publication Date: 2016-06-30
- Inventor: Takashi ONOSE , Kouji KAKIZAKI , Osamu WAKABAYASHI , Akiyoshi SUZUKI
- Applicant: Gigaphoton Inc.
- Applicant Address: JP Oyama-shi
- Assignee: Gigaphoton Inc.
- Current Assignee: Gigaphoton Inc.
- Current Assignee Address: JP Oyama-shi
- Priority: JPPCT/JP2013/069554 20130718
- Main IPC: G03F7/20
- IPC: G03F7/20

Abstract:
An exposure apparatus may include a laser light source capable of varying a wavelength of a laser beam that is emitted from the laser light source, a mask on which a pattern is formed, the pattern being configured to generate diffracted light by being irradiated with the laser beam, and a controller configured to control, in accordance with a distance between the mask and a substrate, the wavelength of the laser beam that is emitted from the laser light source, wherein the mask is irradiated with the laser beam emitted from the laser light source to perform proximity exposure on a surface of the substrate.
Public/Granted literature
- US09791780B2 Exposure apparatus Public/Granted day:2017-10-17
Information query
IPC分类: