发明申请
US20160161429A1 SYSTEMS AND METHODS FOR DETERMINISTIC EMITTER SWITCH MICROSCOPY
有权
用于确定发射器开关显微镜的系统和方法
- 专利标题: SYSTEMS AND METHODS FOR DETERMINISTIC EMITTER SWITCH MICROSCOPY
- 专利标题(中): 用于确定发射器开关显微镜的系统和方法
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申请号: US14227076申请日: 2014-03-27
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公开(公告)号: US20160161429A1公开(公告)日: 2016-06-09
- 发明人: Dirk R. Englund , Edward H. Chen , Ophir Gaathon
- 申请人: THE TRUSTEES OF COLUMBIA UNIVERSITY IN THE CITY OF NEW YORK
- 主分类号: G01N24/00
- IPC分类号: G01N24/00 ; G01N21/64
摘要:
Techniques for deterministic switch microscopy include resolving at least one nitrogen vacancy center in a diamond structure. A magnetic field can be applied across the diamond structure and the nitrogen vacancy centers can be optically excited. The nitrogen vacancy centers can be switched from a dark state to a bright state or a bright state by a dark state by applying at least one microwave pulse. A fluorescent response of each nitrogen vacancy center can be detected and a nitrogen vacancy center can be resolved based on the fluorescent response of each nitrogen vacancy center as it corresponds to the orientation of the nitrogen vacancy center relative to the applied magnetic field.
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