Invention Application
US20160126096A1 METHOD OF FORMING AN EPITAXIAL LAYER ON A SUBSTRATE, AND APPARATUS AND SYSTEM FOR PERFORMING THE SAME
审中-公开
在基材上形成外延层的方法,以及用于实施其的装置和系统
- Patent Title: METHOD OF FORMING AN EPITAXIAL LAYER ON A SUBSTRATE, AND APPARATUS AND SYSTEM FOR PERFORMING THE SAME
- Patent Title (中): 在基材上形成外延层的方法,以及用于实施其的装置和系统
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Application No.: US14994120Application Date: 2016-01-12
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Publication No.: US20160126096A1Publication Date: 2016-05-05
- Inventor: Sung-Ho KANG , Bong-Jin KUH , Yong-Kyu JOO , Sung-Ho HEO , Hee-Seok KIM , Yong-Sung PARK
- Applicant: Samsung Electronics Co., Ltd.
- Applicant Address: KR Cheonan-si
- Assignee: Kookje Electric Korea Co., Ltd.
- Current Assignee: Kookje Electric Korea Co., Ltd.
- Current Assignee Address: KR Cheonan-si
- Priority: KR10-2013-0002954 20130110
- Main IPC: H01L21/02
- IPC: H01L21/02 ; H01L21/3065

Abstract:
In a method of forming an epitaxial layer, an etching gas may be decomposed to form decomposed etching gases. A source gas may be decomposed to form decomposed source gases. The decomposed source gases may be applied to a substrate to form the epitaxial layer on the substrate. A portion of the epitaxial layer on a specific region of the substrate may be etched using the decomposed etching gases. Before the etching gas is introduced into the reaction chamber, the etching gas may be previously decomposed. The decomposed etching gases may then be introduced into the reaction chamber to etch the epitaxial layer on the substrate. As a result, the epitaxial layer on the substrate may have a uniform distribution.
Public/Granted literature
- US09589795B2 Method of forming an epitaxial layer on a substrate, and apparatus and system for performing the same Public/Granted day:2017-03-07
Information query
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