Invention Application
US20160018537A1 METHOD AND APPARATUS FOR PROCESSING SIGNALS OF SEMICONDUCTOR DETECTOR
有权
用于处理半导体检测器信号的方法和装置
- Patent Title: METHOD AND APPARATUS FOR PROCESSING SIGNALS OF SEMICONDUCTOR DETECTOR
- Patent Title (中): 用于处理半导体检测器信号的方法和装置
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Application No.: US14800635Application Date: 2015-07-15
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Publication No.: US20160018537A1Publication Date: 2016-01-21
- Inventor: Lan ZHANG , Yulan LI , Yuanjing LI , Jianqiang FU , Yingshuai DU , Wei ZHANG , Xuming MA , Jun LI
- Applicant: TSINGHUA UNIVERSITY , NUCTECH COMPANY LIMITED
- Priority: CN201410336256.X 20140715
- Main IPC: G01T1/24
- IPC: G01T1/24 ; H04N5/32

Abstract:
The present invention provides a method and apparatus for processing signals of a semiconductor detector, including: acquiring a relationship of a time difference between anode and cathode signals of the semiconductor detector with an anode signal amplitude; obtaining an optimal data screening interval according to the relationship of the time difference between anode and cathode signals of the semiconductor detector with the anode signal amplitude, wherein the optimal data screening interval is an interval where the time difference between the anode and cathode signals is greater than 50 ns; and screening and processing the collected data according to the optimal data screening interval when the semiconductor detector collects data. The present invention better overcomes the inherent crystal defects of the detector, reduces the effect of background noise, increases the energy resolution of the cadmium zinc telluride detector under room temperature, and improves the peak-to-compton ratio.
Public/Granted literature
- US09835739B2 Method and apparatus for processing signals of semiconductor detector Public/Granted day:2017-12-05
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