发明申请
US20150206659A1 METHOD OF MANUFACTURING HIGH PERMITTIVITY LOW LEAKAGE CAPACITOR AND ENERGY STORING DEVICE 有权
制造高容量低漏电容器和能源储存装置的方法

  • 专利标题: METHOD OF MANUFACTURING HIGH PERMITTIVITY LOW LEAKAGE CAPACITOR AND ENERGY STORING DEVICE
  • 专利标题(中): 制造高容量低漏电容器和能源储存装置的方法
  • 申请号: US14668768
    申请日: 2015-03-25
  • 公开(公告)号: US20150206659A1
    公开(公告)日: 2015-07-23
  • 发明人: David Reginald Carver
  • 申请人: Carver Scientific, Inc.
  • 申请人地址: US LA Baton Rouge
  • 专利权人: Carver Scientific, Inc.
  • 当前专利权人: Carver Scientific, Inc.
  • 当前专利权人地址: US LA Baton Rouge
  • 主分类号: H01G4/04
  • IPC分类号: H01G4/04
METHOD OF MANUFACTURING HIGH PERMITTIVITY LOW LEAKAGE CAPACITOR AND ENERGY STORING DEVICE
摘要:
A method is provided for making a high permittivity dielectric material for use in capacitors. Several high permittivity materials in an organic nonconductive media with enhanced properties and methods for making the same are disclosed. A general method for the formation of thin films of some particular dielectric material is disclosed, wherein organic polymers are utilized to produce low conductivity dielectric coatings. Additionally, a method whereby the formation of certain transition metal salts as salt or oxide matrices is demonstrated at low temperatures utilizing mild reducing agents. Further, a circuit structure and associated method of operation for the recovery and regeneration of the leakage current from the long-term storage capacitors is provided in order to enhance the manufacturing yield and utility performance of such devices.
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