发明申请
- 专利标题: Lithography Mask
- 专利标题(中): 平版印刷面膜
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申请号: US14158068申请日: 2014-01-17
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公开(公告)号: US20150205194A1公开(公告)日: 2015-07-23
- 发明人: Yun-Yue LIN , Hsin-Chang Lee , Chia-Jen Chen , Anthony Yen
- 申请人: Taiwan Semiconductor Manufacturing Company, Ltd.
- 申请人地址: TW Hsin-Chu
- 专利权人: Taiwan Semiconductor Manufacturing Company, Ltd.
- 当前专利权人: Taiwan Semiconductor Manufacturing Company, Ltd.
- 当前专利权人地址: TW Hsin-Chu
- 主分类号: G03F1/48
- IPC分类号: G03F1/48
摘要:
The present disclosure provides a lithography mask comprising a substrate, a reflective multiplayer (ML) on the substrate, a barrier layer on the reflective ML, and an absorber layer over the barrier layer. In some embodiments, a thickness of the barrier layer is less than or equal to about 10 nm. In some embodiments, a portion of the absorber layer and a portion of the barrier layer are removed. The present disclosure also provides a method for fabricating a lithography mask, and a method for patterning a substrate using a lithography mask.
公开/授权文献
- US09366953B2 Lithography mask 公开/授权日:2016-06-14
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