发明申请
US20150204784A1 STANDARDIZING FLUORESCENCE MICROSCOPY SYSTEMS 有权
标准化荧光显微系统

STANDARDIZING FLUORESCENCE MICROSCOPY SYSTEMS
摘要:
Systems and methods for standardizing one or more fluorescence scanning instruments to a reference system by separating the effects of drift and normalization. In an embodiment, a drift image comprising an image of a drift reference slide is captured by a system to be standardized. A drift measurement is calculated using the drift image. A first normalization image comprising an image of a normalization slide is also captured by the system to be standardized. A reference normalization image, also comprising an image of the normalization slide, is captured by a reference system. The first normalization image is compared to the reference normalization image to determine a gamma value and offset value for the system to be standardized.
公开/授权文献
信息查询
0/0