发明申请
US20150199802A1 SYSTEM AND METHODS OF INSPECTING AN OBJECT 有权
检查对象的系统和方法

SYSTEM AND METHODS OF INSPECTING AN OBJECT
摘要:
A system for use in inspecting an object is provided. The system includes at least one array of visual imaging devices configured to capture a plurality of two-dimensional images of the object. The array is configured to capture a first set of two-dimensional images over a first predetermined interval and a second set of two-dimensional images over a second predetermined interval that is after the first predetermined interval. The system also includes a computing device coupled to the at least one array of visual imaging devices. The computing device is configured to extract point clouds of the object from the first and second sets of two-dimensional images, generate a three-dimensional model of the object from the extracted point clouds, determine variations in the extracted point clouds from the first and second sets of two-dimensional images, and utilize the determined variations to detect potential anomalies in the three-dimensional model.
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