发明申请
- 专利标题： CHARACTERIZATION OF POLYMER AND COLLOID SOLUTIONS
- 专利标题（中）： 聚合物和胶体溶液的表征
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申请号： US14464658申请日： 2014-08-20
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公开(公告)号： US20150056710A1公开(公告)日： 2015-02-26
- 发明人: Wayne Frederick Reed , Michael Felix Drenski , Alex Wayne Reed
- 申请人： ADVANCED POLYMER MONITORING TECHNOLOGIES, INC.
- 申请人地址： US LA New Orleans US LA New Orleans
- 专利权人： ADVANCED POLYMER MONITORING TECHNOLOGIES, INC.,THE ADMINISTRATORS OF THE TULANE EDUCATIONAL FUND
- 当前专利权人： ADVANCED POLYMER MONITORING TECHNOLOGIES, INC.,THE ADMINISTRATORS OF THE TULANE EDUCATIONAL FUND
- 当前专利权人地址： US LA New Orleans US LA New Orleans
- 主分类号： G01N15/02
- IPC分类号： G01N15/02 ; G01N21/75 ; G01N21/51
摘要：
Simultaneous Multiple Sample Light Scattering systems and methods can be used to for polymer stability testing and for applying stressors to polymer or colloid solutions including heat stress, ultrasound, freeze/thaw cycles, shear stress and exposure to different substances and surfaces. among others, that create a polymer stress response used to characterize the polymer solution and stability.
公开/授权文献
- US09664608B2 Characterization of polymer and colloid solutions 公开/授权日：2017-05-30
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