Invention Application
- Patent Title: ANALYSIS SYSTEM
- Patent Title (中): 分析系统
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Application No.: US14379541Application Date: 2013-02-14
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Publication No.: US20150030260A1Publication Date: 2015-01-29
- Inventor: Takeshi Arikuma , Kazuya Koyama , HIROSHI Yamada , YOICHI Nagai
- Applicant: NEC Corporation
- Applicant Address: JP Minato-ku, Tokyo
- Assignee: NEC CORPORATION
- Current Assignee: NEC CORPORATION
- Current Assignee Address: JP Minato-ku, Tokyo
- Priority: JP2012-046674 20120302
- International Application: PCT/JP2013/000796 WO 20130214
- Main IPC: G06K9/62
- IPC: G06K9/62

Abstract:
An analysis system of the present invention includes: an analysis process executing means for controlling operation of the analysis system configured by a plurality of analysis engines to execute an analysis process; and an input quality regulating means for determining quality characteristics of processing target data inputted into the respective analysis engines so as to satisfy a preset requirement for accuracy of an analysis result, and regulating the quality characteristic of the processing target data inputted into a given analysis engine configuring the analysis system based on the determined quality characteristics.
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