发明申请
- 专利标题: SEMICONDUCTOR PACKAGES AND METHODS OF PACKAGING SEMICONDUCTOR DEVICES
- 专利标题(中): 半导体器件的封装和封装方法
-
申请号: US13831964申请日: 2013-03-15
-
公开(公告)号: US20140264835A1公开(公告)日: 2014-09-18
- 发明人: Chuen Khiang WANG
- 申请人: UNITED TEST AND ASSEMBLY CENTER LTD.
- 申请人地址: SG Singapore
- 专利权人: UNITED TEST AND ASSEMBLY CENTER LTD.
- 当前专利权人: UNITED TEST AND ASSEMBLY CENTER LTD.
- 当前专利权人地址: SG Singapore
- 主分类号: H01L23/498
- IPC分类号: H01L23/498 ; H01L21/768 ; H05K1/02
摘要:
Package substrate, semiconductor packages and methods for forming a semiconductor package are presented. The package substrate includes a base substrate having first and second major surfaces and a plurality of via contacts extending through the first to the second major surfaces of the base substrate. A first conductive layer having a plurality of openings is disposed over the first surface of the base substrate and via contacts. The openings are configured to match conductive trace layout of the package substrate. Conductive traces are disposed over the first conductive layer. The conductive traces are directly coupled to the via contacts through some of the openings of the first conductive layer.
公开/授权文献
信息查询
IPC分类: