Invention Application
- Patent Title: ATTACHED MATTER TESTING DEVICE AND TESTING METHOD
- Patent Title (中): 附带事项测试设备和测试方法
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Application No.: US14349672Application Date: 2012-10-02
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Publication No.: US20140238106A1Publication Date: 2014-08-28
- Inventor: Hideo Kashima , Masakazu Sugaya , Koichi Terada , Yasunori Doi , Yasutaka Suzuki , Hisashi Nagano , Yuichiro Hashimoto , Yasuaki Takada
- Applicant: Hitachi, Ltd.
- Priority: JP2011-221847 20111006
- International Application: PCT/JP2012/075459 WO 20121002
- Main IPC: G01N33/00
- IPC: G01N33/00

Abstract:
Provided is a technique to identify a sample substance attached to an inspection target easily and precisely, while improving the rate of operation and reducing the number of persons required for inspection. A trace detecting system includes detection means to detect the size (vertical and horizontal dimensions) of an inspection target, and selects an air nozzle capable of spraying air jet at 15 m/s or more to the surface of the inspection target for air jet spraying.
Public/Granted literature
- US09696288B2 Attached matter testing device and testing method Public/Granted day:2017-07-04
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