Invention Application
- Patent Title: ABNORMALITY DETECTION SYSTEM FOR ROTATION ANGLE SENSOR
- Patent Title (中): 旋转角传感器异常检测系统
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Application No.: US14133220Application Date: 2013-12-18
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Publication No.: US20140191625A1Publication Date: 2014-07-10
- Inventor: Hiroshi KITAMOTO
- Applicant: JTEKT CORPORATION
- Applicant Address: JP Osaka
- Assignee: JTEKT CORPORATION
- Current Assignee: JTEKT CORPORATION
- Current Assignee Address: JP Osaka
- Priority: JP2013-001077 20130108
- Main IPC: G01R35/00
- IPC: G01R35/00 ; H02K11/00

Abstract:
In an abnormality detection system for a rotation angle sensor, a fact that an abnormality has occurred in one of sine signals (S1, S2) or in one of cosine signals (S3, S4) is detected based on a sum of the electrical signals (S1, S2), and a sum of the electrical signals (S3, S4) (first detection result). A fact that an abnormality has occurred in one of the positive sine and cosine signals (S1, S3) or in one of the negative sine and cosine signals (S2, S4) by comparing a first temperature computed using a correlation between an amplitude and a temperature and based on the electrical signals (S1, S3), a second temperature computed using a correlation between the amplitude and a temperature and based on the electrical signals (S2, S4), and a third temperature detected by a temperature sensor with each other (second detection result). A microcomputer identifies which of the electrical signals is abnormal by comparing the first and second detection results with each other.
Public/Granted literature
- US09341695B2 Abnormality detection system for rotation angle sensor Public/Granted day:2016-05-17
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