发明申请
- 专利标题: INDENTATION TESTER
- 专利标题(中): 印度测试仪
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申请号: US13893481申请日: 2013-05-14
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公开(公告)号: US20130319091A1公开(公告)日: 2013-12-05
- 发明人: Eiji FURUTA , Takeshi SAWA
- 申请人: MITUTOYO CORPORATION
- 申请人地址: JP Kanagawa
- 专利权人: MITUTOYO CORPORATION
- 当前专利权人: MITUTOYO CORPORATION
- 当前专利权人地址: JP Kanagawa
- 优先权: JPJP2012-123893 20120531
- 主分类号: G01N3/44
- IPC分类号: G01N3/44
摘要:
Indentation tester capable of adjusting vertical-direction positioning drift due to individual differences of an indenter when indenters are switched includes an adjustment mechanism. The adjustment mechanism adjusts relative vertical-direction positions of a displacement sensor movable portion and a displacement sensor fixed portion. The adjustment mechanism includes a first hollow disk having a spiraling surface formed on a bottom surface; and a second hollow disk having a spiraling surface formed on a top surface. The spiraling surface of the second hollow disk has a thread equal to that of the spiraling surface of the first hollow disk. The first hollow disk rests on the second hollow disk such that the bottom surface of the first hollow disk is overlaid on the top surface of the second hollow disk. The first hollow disk and the second hollow disk are capable of rotation on a center axis of an indenter column.
公开/授权文献
- US09046456B2 Indentation tester 公开/授权日:2015-06-02
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