Invention Application
- Patent Title: RESISTOR INTEGRATED WITH TRANSISTOR HAVING METAL GATE
- Patent Title (中): 电容器与带有金属栅的晶体管集成
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Application No.: US13949230Application Date: 2013-07-24
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Publication No.: US20130307084A1Publication Date: 2013-11-21
- Inventor: Chun-Mao Chiou , Ti-Bin Chen , Tsung-Min Kuo , Shyan-Liang Chou , Yao-Chang Wang , Chi-Sheng Tseng , Jie-Ning Yang , Po-Jui Liao
- Applicant: United Microelectronics Corp.
- Applicant Address: TW Hsin-Chu City
- Assignee: United Microelectronics Corp.
- Current Assignee: United Microelectronics Corp.
- Current Assignee Address: TW Hsin-Chu City
- Main IPC: H01L27/06
- IPC: H01L27/06

Abstract:
A method of manufacturing a resistor integrated with a transistor having metal gate includes providing a substrate having a transistor region and a resistor region defined thereon, a transistor is positioned in the transistor region and a resistor is positioned in the resistor region; forming a dielectric layer exposing tops of the transistor and the resistor on the substrate; performing a first etching process to remove portions of the resistor to form two first trenches respectively at two opposite ends of the resistor; forming a patterned protecting layer in the resistor region; performing a second etching process to remove a dummy gate of the transistor to form a second trench in the transistor region; and forming a metal layer filling the first trenches and the second trench.
Public/Granted literature
- US08692334B2 Resistor integrated with transistor having metal gate Public/Granted day:2014-04-08
Information query
IPC分类: