Invention Application
- Patent Title: BUMP-ON-TRACE (BOT) STRUCTURES
- Patent Title (中): BUOT-ON-TRACE(BOT)结构
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Application No.: US13610050Application Date: 2012-09-11
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Publication No.: US20130001778A1Publication Date: 2013-01-03
- Inventor: Yuh Chern SHIEH , Han-Ping PU , Yu-Feng CHEN , Tin-Hao KUO
- Applicant: Yuh Chern SHIEH , Han-Ping PU , Yu-Feng CHEN , Tin-Hao KUO
- Applicant Address: TW Hsinchu
- Assignee: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.
- Current Assignee: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.
- Current Assignee Address: TW Hsinchu
- Main IPC: H01L23/498
- IPC: H01L23/498 ; H01L21/56

Abstract:
A bump-on-trace (BOT) structure is described. The BOT structure includes a first work piece with a metal trace on a surface of the first work piece, wherein the metal trace has a first axis. The BOT structure further includes a second work piece with an elongated metal bump, wherein the elongated metal bump has a second axis, wherein the second axis is at a non-zero angle from the first axis. The BOT structure further includes a metal bump, wherein the metal bump electrically connects the metal trace and the elongated metal bump. A package having a BOT structure and a method of forming the BOT structure are also described.
Public/Granted literature
- US09041223B2 Bump-on-trace (BOT) structures Public/Granted day:2015-05-26
Information query
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