发明申请
US20120166144A1 DEVICE CHARACTERISTICS MEASUREMENT METHOD USING AN ALL-OPTOELECTRONIC TERAHERTZ PHOTOMIXING SYSTEM AND SPECTRAL CHARACTERISTICS MEASUREMENT METHOD OF TERAHERTZ MEASURING APPARATUS USING THE SAME 审中-公开
使用全光电式TERAHERTZ光刻系统的设备特性测量方法和使用它的TERAHERTZ测量装置的光谱特性测量方法

DEVICE CHARACTERISTICS MEASUREMENT METHOD USING AN ALL-OPTOELECTRONIC TERAHERTZ PHOTOMIXING SYSTEM AND SPECTRAL CHARACTERISTICS MEASUREMENT METHOD OF TERAHERTZ MEASURING APPARATUS USING THE SAME
摘要:
A device characteristics measurement method using an all-optoelectronic terahertz photomixing system includes: calculating power of an antenna of a transmitter by adding a matching condition between output impedance of the photomixer and input impedance of the antenna of the transmitter to power of the photomixer of the transmitter; calculating power of an antenna of a receiver based on the power of the antenna of the transmitter; and outputting the power of the antenna of the transmitter and the power of the antenna of the receiver so as to analyze device characteristics of the photomixer and the antenna of the transmitter.
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