Invention Application
- Patent Title: AUTHENTICATION OF INTEGRATED CIRCUITS
- Patent Title (中): 集成电路认证
-
Application No.: US13039391Application Date: 2011-03-03
-
Publication No.: US20120033810A1Publication Date: 2012-02-09
- Inventor: Srinivas Devadas , Blaise Gassend
- Applicant: Srinivas Devadas , Blaise Gassend
- Applicant Address: US MA Cambridge
- Assignee: Massachusetts Institute of Technology
- Current Assignee: Massachusetts Institute of Technology
- Current Assignee Address: US MA Cambridge
- Main IPC: H04L9/00
- IPC: H04L9/00
Abstract:
A group of devices are fabricated based on a common design, each device having a corresponding plurality of measurable characteristics that is unique in the group to that device, each device having a measurement module for measuring the measurable characteristics. Authentication of one of the group of devices is enabled by selective measurement of one or more of the plurality of measurable characteristics of the device.
Public/Granted literature
- US08386801B2 Authentication of integrated circuits Public/Granted day:2013-02-26
Information query
