发明申请
- 专利标题: APPARATUS FOR MEASURING MAGNETIC FIELD OF MICROWAVE-ASSISTED HEAD
- 专利标题(中): 用于测量微波辅助磁头的磁场的装置
-
申请号: US12755803申请日: 2010-04-07
-
公开(公告)号: US20110248710A1公开(公告)日: 2011-10-13
- 发明人: Isamu SATO , Hiroshi Ikeda , Mikio Matsuzaki , Tetsuya Roppongi , Noboru Yamanaka , Tsutomu Aoyama
- 申请人: Isamu SATO , Hiroshi Ikeda , Mikio Matsuzaki , Tetsuya Roppongi , Noboru Yamanaka , Tsutomu Aoyama
- 申请人地址: JP Tokyo
- 专利权人: TDK CORPORATION
- 当前专利权人: TDK CORPORATION
- 当前专利权人地址: JP Tokyo
- 主分类号: G01R33/02
- IPC分类号: G01R33/02
摘要:
A measuring circuit system in a magnetic field measuring apparatus of the invention has an amplifier and a band-pass filter connected in sequence on an output terminal side of the TMR element, the band-pass filter is a narrow-range band-pass filter such that a peak pass frequency of the filter that is a center is a basic frequency selected from a range of 10 to 40 GHz and a band width centered around the basic frequency is a narrow range of ±0.5 to ±4 GHz; and with the measuring circuit system, an SIN ratio (SNR) of 3 dB or greater is obtained, the SNR being defined by a ratio of an amplitude S of a high-frequency generated signal induced by the TMR element to a total noise N that is a sum of a head noise generated by the TMR element and a circuit noise generated by the amplifier. With such a configuration, an in-plane high-frequency magnetic field generated by a microwave-assisted magnetic head is reliably and precisely measured.
公开/授权文献
信息查询