Invention Application
- Patent Title: TRANSMISSION ELECTRON MICROSCOPE HAVING ELECTRON SPECTROMETER
- Patent Title (中): 具有电子光谱仪的传输电子显微镜
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Application No.: US13133653Application Date: 2009-11-11
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Publication No.: US20110240854A1Publication Date: 2011-10-06
- Inventor: Shohei Terada , Yoshifumi Taniguchi , Tatsumi Hirano
- Applicant: Shohei Terada , Yoshifumi Taniguchi , Tatsumi Hirano
- Priority: JP2008-312809 20081209
- International Application: PCT/JP2009/005999 WO 20091111
- Main IPC: G01N23/00
- IPC: G01N23/00 ; H01J37/153

Abstract:
In a spectral image formed by two orthogonal axes, one of which is an axis of the amount of energy loss and the other of which is an axis of positional information, by the use of an electron spectrometer and a transmission electron microscope, distortion in the spectral image of a sample to be analyzed is corrected with high efficiency and high accuracy by comparing electron beam positions calculated from a two-dimensional electron beam position image formed by the two orthogonal axes (the axis of the amount of energy loss and the axis of positional information) with reference electron beam positions, and calculating amounts of the distortion based on the differences of the electron beam positions. Method and apparatus are offered which correct distortion in a spectral image with high efficiency and high accuracy, the image being formed by the two orthogonal axes (the axis of the amount of energy loss and the axis of positional information).
Public/Granted literature
- US08436301B2 Transmission electron microscope having electron spectrometer Public/Granted day:2013-05-07
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