发明申请
- 专利标题: Method and Device for Determining a Frequency Mask for a Frequency Spectrum
- 专利标题(中): 用于确定频谱的频谱的方法和装置
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申请号: US12967881申请日: 2010-12-14
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公开(公告)号: US20110153247A1公开(公告)日: 2011-06-23
- 发明人: Hagen Eckert , Jochen Pliquett
- 申请人: Hagen Eckert , Jochen Pliquett
- 申请人地址: DE Munchen
- 专利权人: Rohde & Schwarz GmbH & Co. KG.
- 当前专利权人: Rohde & Schwarz GmbH & Co. KG.
- 当前专利权人地址: DE Munchen
- 优先权: DE102009058741.1 20091217; DE102010020910.4 20100518
- 主分类号: G06F19/00
- IPC分类号: G06F19/00 ; G01R23/16
摘要:
A method and a device for determining a frequency mask disposed above or below a frequency spectrum of a detected signal determines every individual ordinate value of a first envelope curve disposed completely above or below the frequency spectrum as the maximum value or minimum value of a given number of respectively adjacent ordinate values of the frequency spectrum linked to a window function. Following this, each individual ordinate value of a second envelope curve disposed completely above or below the frequency spectrum and completely above or below the first envelope curve is determined as the maximum value or minimum value of a given number of respectively adjacent ordinate values of the frequency spectrum linked to a window function. Finally, a minimum number of ordinate values of the frequency mask from ordinate values of the first and/or second envelope curve disposed completely between the first and second envelope curve is determined, wherein in each case two successive ordinate values of the frequency mask with a maximum horizontal spacing distance within the first and second envelope curve can be reached in a linear manner relative to one another.
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