发明申请
- 专利标题: MEMS-BASED FTIR SPECTROMETER
- 专利标题(中): 基于MEMS的FTIR光谱仪
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申请号: US12989871申请日: 2009-08-04
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公开(公告)号: US20110139990A1公开(公告)日: 2011-06-16
- 发明人: Huikai Xie , Lei Wu , Andrea Pais , Sean Robert Samuelson
- 申请人: Huikai Xie , Lei Wu , Andrea Pais , Sean Robert Samuelson
- 申请人地址: US FL Gainesville
- 专利权人: University of Florida Research Foundation, Inc.
- 当前专利权人: University of Florida Research Foundation, Inc.
- 当前专利权人地址: US FL Gainesville
- 国际申请: PCT/US09/52705 WO 20090804
- 主分类号: G01N21/35
- IPC分类号: G01N21/35 ; G01J3/45
摘要:
A MEMS-based Fourier Transform (FT) spectrometer is provided. According to an embodiment, the MEMS-based FT spectrometer is an FT infrared (FTIR) spectrometer. The FT spectrometer can include a beam splitter positioned to receive an incoming beam from a light source and split the incoming beam into a first sub-beam and a second sub-beam, a fixed mirror positioned to receive the first sub-beam from the beam splitter, a scanning MEMS mirror positioned to receive the second sub-beam from the beam splitter, and a photodetector, wherein a reflected first sub-beam from the fixed mirror and a reflected second sub-beam from the scanning MEMS mirror recombine at the beam splitter and become directed to the photodetector. According to one embodiment, the photodetector is a MEMS-based IR detector. In addition, the MEMS-based IR detector can be an un-cooled IR detector having a capacitive sensing structure.
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