Invention Application
- Patent Title: X-RAY SOURCE AND X-RAY SYSTEM
- Patent Title (中): X射线源和X射线系统
-
Application No.: US13054371Application Date: 2009-06-09
-
Publication No.: US20110122992A1Publication Date: 2011-05-26
- Inventor: Wilhelm Hanke , Thomas Mertelmeier
- Applicant: Wilhelm Hanke , Thomas Mertelmeier
- Priority: DE102008033150.3 20080715
- International Application: PCT/EP09/57085 WO 20090609
- Main IPC: A61B6/04
- IPC: A61B6/04 ; H01J35/10 ; G01N23/04

Abstract:
An x-ray source has multiple electron sources spaced apart from each other along a longitudinal direction that is defined as being parallel to the rotation axis of a rotating anode which is common to all of the electron sources. Each electron source emits electrons that strike the anode at respective strike points that are spatially separated from each other along the longitudinal direction, to produce respective emission centers, from which x-rays are emitted, each emission center being associated with respective ones of the x-ray sources.
Public/Granted literature
- US08619946B2 X-ray source and X-ray system Public/Granted day:2013-12-31
Information query