发明申请
- 专利标题: BONDING WIRE
- 专利标题(中): 绑线
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申请号: US12740588申请日: 2008-09-11
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公开(公告)号: US20110058979A1公开(公告)日: 2011-03-10
- 发明人: Hiroshi Murai , Jun Chiba , Fujio Amada
- 申请人: Hiroshi Murai , Jun Chiba , Fujio Amada
- 申请人地址: JP Tokyo
- 专利权人: TANAKA DENSHI KOGYO K. K.
- 当前专利权人: TANAKA DENSHI KOGYO K. K.
- 当前专利权人地址: JP Tokyo
- 优先权: JP2007-289091 20071106
- 国际申请: PCT/JP2008/066442 WO 20080911
- 主分类号: C22C5/02
- IPC分类号: C22C5/02
摘要:
[Issues to be Solved] Second bonding failures caused by attached oxide of additive elements on high purity Au bonding wire are to be resolved.[Solution Means] Au alloy bonding wires comprising: 5-100 wt ppm Mg, 5-20 wt ppm In, 5-20 wt ppm Al, 5-20 wt ppm Yb, and residual Au of 99.995 wt % purity or higher, and adding 5-20 wt ppm Ca, and for these alloys adding at least one element among 5-20 wt ppm La, 5-20 wt ppm Lu, 5-100 wt ppm Sn, 5-100 wt ppm Sr to the alloy, and/or, moreover, adding 0.01-1.2 wt % Pd to these alloys. Bonding wire, which contains these trace additive elements do not cause a disturbance by accumulated contamination, because of contamination, which formed at ball formation by micro discharge and at the first bonding on the tip of the capillary, transferring to the wire at second bonding.
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