Invention Application
- Patent Title: INSPECTING DEVICE INCLUDING DETACHABLE PROBE
- Patent Title (中): 检查设备，包括可拆卸探头
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Application No.: US12575650Application Date: 2009-10-08
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Publication No.: US20110030478A1Publication Date: 2011-02-10
- Inventor: Minsu Park , Jangmyong Woo , Gyungsub Kim , Sanghoon Choi
- Applicant: Minsu Park , Jangmyong Woo , Gyungsub Kim , Sanghoon Choi
- Assignee: Korea Plant Service & Engineering Co., Ltd.
- Current Assignee: Korea Plant Service & Engineering Co., Ltd.
- Priority: KR10-2009-0072254 20090806
- Main IPC: G01N29/04
- IPC: G01N29/04 ; G01N27/87
Abstract:
An inspecting device including a detachable probe has a link structure, and thus a subject having various diameters is tested. In addition, since various probes are changeably used in a scanner housing, ultrasonic wave testing and eddy current testing are simultaneously performed.
Public/Granted literature
- US08424385B2 Inspecting device including detachable probe Public/Granted day:2013-04-23
Information query
