发明申请
- 专利标题: METHOD AND APPARATUS FOR ION FRAGMENTATION IN MASS SPECTROMETRY
- 专利标题(中): 用于离子质谱分析的方法和装置
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申请号: US12784532申请日: 2010-05-21
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公开(公告)号: US20100288920A1公开(公告)日: 2010-11-18
- 发明人: Vladimir M. Doroshenko , Vadym D. Berkout , Andrey Vilkov
- 申请人: Vladimir M. Doroshenko , Vadym D. Berkout , Andrey Vilkov
- 申请人地址: US MD Columbia
- 专利权人: Science & Engineering Services, Inc.
- 当前专利权人: Science & Engineering Services, Inc.
- 当前专利权人地址: US MD Columbia
- 主分类号: H01J49/00
- IPC分类号: H01J49/00 ; B01D59/44
摘要:
A method for fragmentation of analyte ions for mass spectroscopy and a system for mass spectroscopy. The method produces gas-phase analyte ions, produces gas-phase odd-electron containing species separately from the analyte ions, and mixes the gas-phase analyte ions and the odd-electron containing species at substantially atmospheric pressure conditions to produce fragment ions prior to introduction into a mass spectrometer. The system includes a gas-phase analyte ion source, a gas-phase odd-electron containing species source separate from the gas-phase analyte ion source, a mixing region where the gas-phase analyte ions and the odd-electron containing species are mixed at substantially atmospheric pressure to produce fragment ions of the analyte ions, a mass spectrometer having an entrance where at least a portion of the fragment ions are introduced into a vacuum of the mass spectrometer, and a detector in the mass spectrometer which determines a mass to charge ratio analysis of the fragment ions.
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