发明申请
- 专利标题: Method of correcting a position of a prober
- 专利标题(中): 纠正探测器位置的方法
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申请号: US12656520申请日: 2010-02-02
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公开(公告)号: US20100194418A1公开(公告)日: 2010-08-05
- 发明人: Seung-Yong Oh , Byoung Joo Kim , Dae-Gab Chi , Ki-Yoon Kim
- 申请人: Seung-Yong Oh , Byoung Joo Kim , Dae-Gab Chi , Ki-Yoon Kim
- 优先权: KR10-2009-0008227 20090203
- 主分类号: G01R31/02
- IPC分类号: G01R31/02
摘要:
A method of correcting a position of a prober, the method including obtaining a first image of a pad, the pad having a predetermined reference contact position, contacting the prober to the pad after obtaining the first image of the pad, obtaining a second image of the pad after contacting the prober to the pad, determining an actual contact position of an actual contact mark on the pad, the actual contact mark being produced by the contacting of the prober to the pad, comparing the second image to the first image to obtain an offset data, the offset data relating the actual contact position to the reference contact position, and correcting the position of the prober by aligning the actual contact position with the reference contact position based on the offset data.
公开/授权文献
- US08400174B2 Method of correcting a position of a prober 公开/授权日:2013-03-19
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