发明申请
- 专利标题： Probing analog signals
- 专利标题（中）： 探测模拟信号
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申请号： US12316900申请日： 2008-12-17
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公开(公告)号： US20100153032A1公开(公告)日： 2010-06-17
- 发明人: Amir Mezer , Assaf Benhamou
- 申请人： Amir Mezer , Assaf Benhamou
- 专利权人： Intel Corporation
- 当前专利权人： Intel Corporation
- 主分类号： G01R15/00
- IPC分类号： G01R15/00 ; H03K5/153
摘要：
A device, comprising a monitoring slicer adapted to repeatedly sample an internal analog signal to provide a sequence of digital outputs indicating a result of a comparison of the level of the internal analog signal to a reference voltage and an operative unit adapted to perform a task of the device and provide a result without using digital outputs from the monitoring slicer.
公开/授权文献
- US08175823B2 Probing analog signals 公开/授权日：2012-05-08
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