发明申请
- 专利标题: Apparatus for Sub-Wavelength Near-Field Focusing of Electromagnetic Waves
- 专利标题(中): 用于亚波长近场聚焦电磁波的设备
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申请号: US12123434申请日: 2008-05-19
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公开(公告)号: US20090303154A1公开(公告)日: 2009-12-10
- 发明人: Anthony Grbic , Roberto D. Merlin
- 申请人: Anthony Grbic , Roberto D. Merlin
- 申请人地址: US MI Ann Arbor
- 专利权人: THE REGENTS OF THE UNIVERSITY OF MICHIGAN
- 当前专利权人: THE REGENTS OF THE UNIVERSITY OF MICHIGAN
- 当前专利权人地址: US MI Ann Arbor
- 主分类号: G21K1/00
- IPC分类号: G21K1/00 ; H01Q15/02 ; G02B3/00
摘要:
Planar sub-wavelength structures provide superlensing, i.e., electromagnetic focusing beyond the diffraction limit. The planar structures use diffraction to force the input field to converge to a spot on the focal plane. The sub-wavelength patterned structures manipulate the output wave in such a manner as to form a sub-wavelength focus in the near field. In some examples, the sub-wavelength structures may be linear grating-like structures that can focus electromagnetic radiation to lines of arbitrarily small sub-wavelength dimension, or two dimensional grating-like structures and Bessel (azimuthally symmetric) structures that can focus to spots of arbitrarily small sub-wavelength dimensions. The particular pattern for the sub-wavelength structures may be derived from the desired focus. Some examples describe sub-wavelength structures that have been implemented to focus microwave radiation to sub-wavelength dimensions in the near field.
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