Invention Application
US20090244335A1 CORRELATED DOUBLE SAMPLING CIRCUIT AND CMOS IMAGE SENSOR UNIT 失效
相关的双重采样电路和CMOS图像传感器单元

  • Patent Title: CORRELATED DOUBLE SAMPLING CIRCUIT AND CMOS IMAGE SENSOR UNIT
  • Patent Title (中): 相关的双重采样电路和CMOS图像传感器单元
  • Application No.: US12125914
    Application Date: 2008-05-23
  • Publication No.: US20090244335A1
    Publication Date: 2009-10-01
  • Inventor: Kuo-Yu Chou
  • Applicant: Kuo-Yu Chou
  • Applicant Address: TW Hsinchu
  • Assignee: NOVATEK MICROELECTRONICS CORP.
  • Current Assignee: NOVATEK MICROELECTRONICS CORP.
  • Current Assignee Address: TW Hsinchu
  • Priority: TW97111537 20080328
  • Main IPC: H04N3/14
  • IPC: H04N3/14
CORRELATED DOUBLE SAMPLING CIRCUIT AND CMOS IMAGE SENSOR UNIT
Abstract:
Embodiments of the present invention provide a correlated double sampling (CDS) circuit and a CMOS image sensor unit using the CDS circuit. The CDS circuit shifts levels of sampled sensing signal and reset signal with equal amounts. Thus a voltage difference of the sampled sensing signal and the reset signal remains unchanged, and their levels may fall within a linear input range by adjusting their levels. Compared to a conventional CDS circuit, a gain of the CDS circuit provided by the embodiment of the present invention is not reduced, and thus a design complexity of a rear circuit thereof is lower, and an induced noise is relatively low. Furthermore, the CMOS image sensor unit using the CDS circuit provided by the embodiment also has these advantages.
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