发明申请
US20090127664A1 GROUP III NITRIDE SEMICONDUCTOR CRYSTAL GROWING METHOD, GROUP III NITRIDE SEMICONDUCTOR CRYSTAL SUBSTRATE FABRICATION METHOD, AND GROUP III NITRIDE SEMICONDUCTOR CRYSTAL SUBSTRATE
审中-公开
第III组氮化物半导体晶体生长方法,第III族氮化物半导体晶体基板制造方法和III族氮化物半导体晶体基板
- 专利标题: GROUP III NITRIDE SEMICONDUCTOR CRYSTAL GROWING METHOD, GROUP III NITRIDE SEMICONDUCTOR CRYSTAL SUBSTRATE FABRICATION METHOD, AND GROUP III NITRIDE SEMICONDUCTOR CRYSTAL SUBSTRATE
- 专利标题(中): 第III组氮化物半导体晶体生长方法,第III族氮化物半导体晶体基板制造方法和III族氮化物半导体晶体基板
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申请号: US12273179申请日: 2008-11-18
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公开(公告)号: US20090127664A1公开(公告)日: 2009-05-21
- 发明人: Takuji OKAHISA , Tomohiro Kawase , Tomoki Uemura , Muneyuki Nishioka , Satoshi Arakawa
- 申请人: Takuji OKAHISA , Tomohiro Kawase , Tomoki Uemura , Muneyuki Nishioka , Satoshi Arakawa
- 申请人地址: JP Osaka-shi
- 专利权人: Sumitomo Electric Industries, Ltd.
- 当前专利权人: Sumitomo Electric Industries, Ltd.
- 当前专利权人地址: JP Osaka-shi
- 优先权: JP2007-300461 20071120
- 主分类号: H01L31/20
- IPC分类号: H01L31/20 ; H01L29/20
摘要:
A growing method of a group III nitride semiconductor crystal includes the steps of preparing an underlying substrate, and growing a first group III nitride semiconductor crystal doped with silicon by using silicon tetrachloride (SiCl4) gas as doping gas, on the underlying substrate by vapor phase growth. The growth rate of the first group III nitride semiconductor crystal is at least 200 μm/h and not more than 2000 μm/h.
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